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"Test pattern generation for current testable faults in static CMOS circuits."

F. Joel Ferguson, Tracy Larrabee (1991)

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DOI: 10.1109/VTEST.1991.208174

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/FergusonL91
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  persistent URL:
  - https://dblp.org/rec/conf/vts/FergusonL91
F. Joel Ferguson, Tracy Larrabee:
Test pattern generation for current testable faults in static CMOS circuits. VTS 1991: 297-302

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