"Fast path selection for testing of small delay defects considering path ..."

Zijian He et al. (2010)

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DOI: 10.1109/VTS.2010.5469628

access: closed

type: Conference or Workshop Paper

metadata version: 2025-10-14

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Zijian He, Tao Lv, Huawei Li, Xiaowei Li:
Fast path selection for testing of small delay defects considering path correlations. VTS 2010: 3-8

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