"Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact ..."

Sujay Pandey et al. (2021)

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DOI: 10.1109/VTS50974.2021.9441005

access: closed

type: Conference or Workshop Paper

metadata version: 2021-06-09

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Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee:
Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts. VTS 2021: 1-7

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