"Too many faults, too little time on creating test sets for enhanced ..."

Yiwen Shi, Wan-Chan Hu, Jennifer Dworak (2010)

> Home

Details and statistics

DOI: 10.1109/VTS.2010.5469545

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/vts/ShiHD10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/vts/ShiHD10
Yiwen Shi, Wan-Chan Hu, Jennifer Dworak:
Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects. VTS 2010: 319-324

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.