"Socillator Test: A Delay Test Scheme for Embedded ICs in the Boundary-Scan ..."

Tek Jau Tan, Chung-Len Lee (2001)

Details and statistics

DOI: 10.1109/VTS.2001.923433

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics