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"Automated test pattern generation for analog integrated circuits."

Wim Verhaegen, Geert Van der Plas, Georges G. E. Gielen (1997)

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DOI: 10.1109/VTEST.1997.600291

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/VerhaegenPG97
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  persistent URL:
  - https://dblp.org/rec/conf/vts/VerhaegenPG97
Wim Verhaegen, Geert Van der Plas, Georges G. E. Gielen:
Automated test pattern generation for analog integrated circuits. VTS 1997: 296-301

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