"On the parametric failures of SRAM in a 3D-die stack considering ..."

Wen Yueh et al. (2012)

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DOI: 10.1109/VTS.2012.6231064

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  - conf/vts/YuehCTM12
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Wen Yueh, Subho Chatterjee, Amit Ranjan Trivedi, Saibal Mukhopadhyay:
On the parametric failures of SRAM in a 3D-die stack considering tier-to-tier supply cross-talk. VTS 2012: 264-269

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