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"Automatic Insertion of Scan Structures to Enhance Testability of Embedded ..."

Kamran Zarrineh, Shambhu J. Upadhyaya, Philip Shephard III (1998)

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DOI: 10.1109/VTEST.1998.670855

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/ZarrinehUS98
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  persistent URL:
  - https://dblp.org/rec/conf/vts/ZarrinehUS98
Kamran Zarrineh, Shambhu J. Upadhyaya, Philip Shephard III:
Automatic Insertion of Scan Structures to Enhance Testability of Embedded Memories, Cores and Chips. VTS 1998: 98-105

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