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"Robust Feature Extraction for Facial Image Quality Assessment."

Thi Hai Binh Nguyen, Van Huan Nguyen, Hakil Kim (2010)

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DOI: 10.1007/978-3-642-17955-6_22

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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  dblp key:
  - conf/wisa/NguyenNK10
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Thi Hai Binh Nguyen, Van Huan Nguyen, Hakil Kim:
Robust Feature Extraction for Facial Image Quality Assessment. WISA 2010: 292-306

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