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"Test compression for scan circuits using scan polarity adjustment and ..."
Yasumi Doi et al. (2005)
- Yasumi Doi, Seiji Kajihara, Xiaoqing Wen, Lei Li, Krishnendu Chakrabarty:
Test compression for scan circuits using scan polarity adjustment and pinpoint test relaxation. ASP-DAC 2005: 59-64
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