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"The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation ..."

Il-soo Lee, Yong Min Hur, Tony Ambler (2004)

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DOI: 10.1109/ATS.2004.85

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Il-soo Lee, Yong Min Hur, Tony Ambler:
The Efficient Multiple Scan Chain Architecture Reducing Power Dissipation and Test Time. Asian Test Symposium 2004: 94-97

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