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"Enhancing multiple fault diagnosis in combinational circuits based on ..."

Hiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu (1995)

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DOI: 10.1109/ATS.1995.485317

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  - https://dblp.org/rec/conf/ats/TakahashiYT95
Hiroshi Takahashi, Nobuhiro Yanagida, Yuzo Takamatsu:
Enhancing multiple fault diagnosis in combinational circuits based on sensitized paths and EB testing. Asian Test Symposium 1995: 58-64

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