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"Sequential Test Generation at the Register-Transfer and Logic Levels."

Abhijit Ghosh, Srinivas Devadas, A. Richard Newton (1990)

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DOI: 10.1145/123186.123408

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/dac/GhoshDN90a
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Abhijit Ghosh, Srinivas Devadas, A. Richard Newton:
Sequential Test Generation at the Register-Transfer and Logic Levels. DAC 1990: 580-586

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