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"Layout-aware pseudo-functional testing for critical paths considering ..."

Xiao Liu et al. (2010)

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DOI: 10.1109/DATE.2010.5457037

access: closed

type: Conference or Workshop Paper

metadata version: 2018-09-10

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/date/LiuZYX10
Xiao Liu, Yubin Zhang, Feng Yuan, Qiang Xu:
Layout-aware pseudo-functional testing for critical paths considering power supply noise effects. DATE 2010: 1432-1437

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