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"Low-cost high-accuracy variation characterization for nanoscale IC ..."

Zhijian Pan et al. (2018)

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DOI: 10.23919/DATE.2018.8342115

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-02

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  dblp key:
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Zhijian Pan, Miao Li, Jian Yao, Hong Lu, Zuochang Ye, Yanfeng Li, Yan Wang:
Low-cost high-accuracy variation characterization for nanoscale IC technologies via novel learning-based techniques. DATE 2018: 797-802

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