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"Iddq Testing for High Performance CMOS - The Next Ten Years."

Thomas W. Williams et al. (1996)

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DOI: 10.1109/EDTC.1996.494359

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-20

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  dblp key:
  - conf/date/WilliamsKMDM96
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  persistent URL:
  - https://dblp.org/rec/conf/date/WilliamsKMDM96
Thomas W. Williams, Rohit Kapur, M. Ray Mercer, Robert H. Dennard, Wojciech Maly:
Iddq Testing for High Performance CMOS - The Next Ten Years. ED&TC 1996: 578-583

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