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"Test solution for data retention faults in low-power SRAMs."

Leonardo Bonet Zordan et al. (2013)

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DOI: 10.7873/DATE.2013.099

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  dblp key:
  - conf/date/ZordanBDGTVB13
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  persistent URL:
  - https://dblp.org/rec/conf/date/ZordanBDGTVB13
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine:
Test solution for data retention faults in low-power SRAMs. DATE 2013: 442-447

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