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"AFFCCA: a tool for critical area analysis with circular defects and ..."

Igor Bubel et al. (1995)

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DOI: 10.1109/DFTVS.1995.476932

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/dft/BubelMWNHSG95
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  persistent URL:
  - https://dblp.org/rec/conf/dft/BubelMWNHSG95
Igor Bubel, Wojciech Maly, Thomas Waas, Pranab K. Nag, Hans Hartmann, Doris Schmitt-Landsiedel, Susanne Griep:
AFFCCA: a tool for critical area analysis with circular defects and lithography deformed layout. DFT 1995: 10-18

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