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"A probabilistic approach for defect detection based on saliency mechanisms."

Francisco Bonnín-Pascual, Alberto Ortiz (2014)

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DOI: 10.1109/ETFA.2014.7005257

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

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  - conf/etfa/Bonnin-PascualO14
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Francisco Bonnín-Pascual, Alberto Ortiz:
A probabilistic approach for defect detection based on saliency mechanisms. ETFA 2014: 1-4

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