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"Efficient yield estimation through generalized importance sampling with ..."
Lorenzo Ciampolini et al. (2016)
- Lorenzo Ciampolini, Jean-Christophe Lafont, Faress Tissafi Drissi, Jean-Paul Morin, David Turgis, Xavier Jonsson, Cyril Desclèves, Joseph Nguyen:
Efficient yield estimation through generalized importance sampling with application to NBL-assisted SRAM bitcells. ICCAD 2016: 89
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