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"Noise characterization of the 0.35 μm CMOS analog process implemented ..."

Igor Brouk, Yael Nemirovsky (2004)

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DOI: 10.1109/ICECS.2004.1399642

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Igor Brouk, Yael Nemirovsky:
Noise characterization of the 0.35 μm CMOS analog process implemented in regular and SOI wafers. ICECS 2004: 171-174

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