"Parallelizing a Defect Detection and Categorization Application."

Leonid Glimcher et al. (2005)

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DOI: 10.1109/IPDPS.2005.332

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Leonid Glimcher, Gagan Agrawal, Sameep Mehta, Ruoming Jin, Raghu Machiraju:
Parallelizing a Defect Detection and Categorization Application. IPDPS 2005

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