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"Reliability of Industrial grade Embedded-STT-MRAM."

Yongsung Ji et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129178

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-12

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  dblp key:
  - conf/irps/JiGLJUKSLPJHLLH20
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  persistent URL:
  - https://dblp.org/rec/conf/irps/JiGLJUKSLPJHLLH20
Yongsung Ji, Hyunjae Goo, Jungman Lim, Tae-Young Jeong, Taiki Uemura, Gun Rae Kim, Boil Seo, Seungbae Lee, Goeun Park, Jeongmin Jo, Sang-Il Han, Kilho Lee, Junghyuk Lee, Sohee Hwang, Daesop Lee, Suksoo Pyo, Hyun Taek Jung, Shinhee Han, Seungmo Noh, Kiseok Suh, Sungyoung Yoon, Hyeonwoo Nam, Hyewon Hwang, Hai Jiang, J. W. Kim, D. Kwon, Yoonjong Song, K. H. Koh, Hwasung Rhee, Sangwoo Pae, E. Lee:
Reliability of Industrial grade Embedded-STT-MRAM. IRPS 2020: 1-3

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