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"Transistor reliability characterization and modeling of the 22FFL FinFET ..."

Chen-Yi Su et al. (2018)

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DOI: 10.1109/IRPS.2018.8353652

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-31

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  dblp key:
  - conf/irps/SuAJKLLMPPPSSSW18
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  - https://dblp.org/rec/conf/irps/SuAJKLLMPPPSSSW18
Chen-Yi Su, M. Armstrong, Lei Jiang, S. A. Kumar, C. D. Landon, S. Liu, Inanc Meric, K. W. Park, Leif Paulson, K. Phoa, Bernhard Sell, Jihan Standfest, Ketul B. Sutaria, J. Wan, D. Young, Stephen Ramey:
Transistor reliability characterization and modeling of the 22FFL FinFET technology. IRPS 2018: 6

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