"Neutron Beam Attenuation Through Semiconductor Devices During SEU Testing."

S. A. Wender et al. (2019)

> Home

Details and statistics

DOI: 10.1109/IRPS.2019.8720477

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/WenderOZB19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/WenderOZB19
S. A. Wender, J. M. O'Donnell, Lukas Zavorka, Bharat L. Bhuva:
Neutron Beam Attenuation Through Semiconductor Devices During SEU Testing. IRPS 2019: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.