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"Technology migration technique for designs with strong RET-driven layout ..."
Xin Yuan et al. (2005)
- Xin Yuan, Kevin W. McCullen, Fook-Luen Heng, Robert F. Walker, Jason Hibbeler, Robert J. Allen, Rani R. Narayan:
Technology migration technique for designs with strong RET-driven layout restrictions. ISPD 2005: 175-182
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