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"Quality of a Bit (QoB): A New Concept in Dependable SRAM."

Hidehiro Fujiwara et al. (2008)

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DOI: 10.1109/ISQED.2008.4479706

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-11

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  dblp key:
  - conf/isqed/FujiwaraOINMKY08
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  persistent URL:
  - https://dblp.org/rec/conf/isqed/FujiwaraOINMKY08
Hidehiro Fujiwara, Shunsuke Okumura, Yusuke Iguchi, Hiroki Noguchi, Yasuhiro Morita, Hiroshi Kawaguchi, Masahiko Yoshimoto:
Quality of a Bit (QoB): A New Concept in Dependable SRAM. ISQED 2008: 98-102

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