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"An IDDQ Based Built-in Concurrent Test Technique for ..."
Chauchin Su, Kychin Hwang, Shyh-Jye Jou (1994)
- Chauchin Su, Kychin Hwang, Shyh-Jye Jou:
An IDDQ Based Built-in Concurrent Test Technique for Interconnects in a Boundary-Scan Environment. ITC 1994: 670-676
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