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"Testing multiple stuck-at faults of ROBDD based combinational circuit design."

Toral Shah et al. (2017)

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DOI: 10.1109/LATW.2017.7906753

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-25

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  dblp key:
  - conf/latw/ShahMKFS17
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  - https://dblp.org/rec/conf/latw/ShahMKFS17
Toral Shah, Anzhela Yu. Matrosova, Binod Kumar, Masahiro Fujita, Virendra Singh:
Testing multiple stuck-at faults of ROBDD based combinational circuit design. LATS 2017: 1-6

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