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"A framework to quantify FPGA design hardness against radiation-induced ..."

David S. Lee, Jeffrey Draper (2014)

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DOI: 10.1109/MWSCAS.2014.6908412

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

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David S. Lee, Jeffrey Draper:
A framework to quantify FPGA design hardness against radiation-induced single event effects. MWSCAS 2014: 302-305

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