Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Residual stress characterization of GaN microstructures using bent-beam ..."

Jianan Lv et al. (2010)

> Home

Details and statistics

DOI: 10.1109/NEMS.2010.5592164

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/nems/LvYYCZC10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/nems/LvYYCZC10
Jianan Lv, Zhenchuan Yang, Guizhen Yan, Yong Cai, Baoshun Zhang, Kevin J. Chen:
Residual stress characterization of GaN microstructures using bent-beam strain sensors. NEMS 2010: 138-140

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.