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"Integrated test concepts for in-situ millimeter-wave device characterization."

Dietmar Kissinger et al. (2015)

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DOI: 10.1109/NEWCAS.2015.7181980

access: closed

type: Conference or Workshop Paper

metadata version: 2020-08-17

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  dblp key:
  - conf/newcas/KissingerNOBNLW15
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  - https://dblp.org/rec/conf/newcas/KissingerNOBNLW15
Dietmar Kissinger, Johannes Nehring, Andreas Oborovski, Karl Borutta, Ismail Nasr, Benjamin Laemmle, Robert Weigel:
Integrated test concepts for in-situ millimeter-wave device characterization. NEWCAS 2015: 1-4

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