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"Application of machine learning methods in post-silicon yield improvement."

Baris Yigit et al. (2017)

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DOI: 10.1109/SOCC.2017.8226049

access: closed

type: Conference or Workshop Paper

metadata version: 2023-11-12

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  dblp key:
  - conf/socc/YigitZLSS17
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  - https://dblp.org/rec/conf/socc/YigitZLSS17
Baris Yigit, Grace Li Zhang, Bing Li, Yiyu Shi, Ulf Schlichtmann:
Application of machine learning methods in post-silicon yield improvement. SoCC 2017: 243-248

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