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"Blackbox identity testing for bounded top fanin depth-3 circuits: the ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Nitin Saxena, C. Seshadhri (2011)

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DOI: 10.1145/1993636.1993694

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-07

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  dblp key:
  - conf/stoc/SaxenaS11
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Nitin Saxena, C. Seshadhri:
Blackbox identity testing for bounded top fanin depth-3 circuits: the field doesn't matter. STOC 2011: 431-440

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