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"Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults ..."

Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski (2015)

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DOI: 10.1109/VLSID.2015.73

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Xijiang Lin, Sudhakar M. Reddy, Janusz Rajski:
Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits. VLSID 2015: 399-404

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