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"Electron Radiation Effects on the 4H-SiC PiN Diodes Characteristics: An ..."

Peng Dong et al. (2019)

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DOI: 10.1109/ACCESS.2019.2955385

access: open

type: Journal Article

metadata version: 2022-08-11

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  - https://dblp.org/rec/journals/access/DongQYXCLC19
Peng Dong, Yazhou Qin, Xuegong Yu, Xingliang Xu, Zhe Chen, Liang-Hui Li, Yingxin Cui:
Electron Radiation Effects on the 4H-SiC PiN Diodes Characteristics: An Insight From Point Defects to Electrical Degradation. IEEE Access 7: 170385-170391 (2019)

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