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"Defect and Error Tolerance in the Presence of Massive Numbers of Defects."

Melvin A. Breuer, Sandeep K. Gupta, T. M. Mak (2004)

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DOI: 10.1109/MDT.2004.8

access: closed

type: Journal Article

metadata version: 2023-09-21

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  dblp key:
  - journals/dt/BreuerGM04
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  persistent URL:
  - https://dblp.org/rec/journals/dt/BreuerGM04
Melvin A. Breuer, Sandeep K. Gupta, T. M. Mak:
Defect and Error Tolerance in the Presence of Massive Numbers of Defects. IEEE Des. Test Comput. 21(3): 216-227 (2004)

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