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"Multiple Fault Diagnosis by Sensitizing Input Pairs."

Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu (1995)

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DOI: 10.1109/MDT.1995.466375

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/YanagidaTT95
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  persistent URL:
  - https://dblp.org/rec/journals/dt/YanagidaTT95
Nobuhiro Yanagida, Hiroshi Takahashi, Yuzo Takamatsu:
Multiple Fault Diagnosis by Sensitizing Input Pairs. IEEE Des. Test Comput. 12(3): 44-52 (1995)

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