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"A Design-Based Structural Test Method for a Switched-Resistor DAC."

Lei Ma et al. (2007)

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DOI: 10.1007/S10836-007-5011-9

access: closed

type: Journal Article

metadata version: 2020-09-11

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Lei Ma, Geert Seuren, Robert Van Rijsinge, Corné Bastiaansen, Leon van der Dussen:
A Design-Based Structural Test Method for a Switched-Resistor DAC. J. Electron. Test. 23(6): 559-567 (2007)

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