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"Design of Memories with Concurrent Error Detection and Correction by ..."

Zhen Wang, Mark G. Karpovsky, Konrad J. Kulikowski (2010)

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DOI: 10.1007/S10836-010-5168-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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Zhen Wang, Mark G. Karpovsky, Konrad J. Kulikowski:
Design of Memories with Concurrent Error Detection and Correction by Nonlinear SEC-DED Codes. J. Electron. Test. 26(5): 559-580 (2010)

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