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ORCID"A scan disabling-based BAST scheme for test cost and test power reduction."
Zhiqiang You et al. (2012)
- Zhiqiang You, Weizheng Wang, Peng Liu, Jishun Kuang, Zheng Qin:
A scan disabling-based BAST scheme for test cost and test power reduction. IEICE Electron. Express 9(2): 111-116 (2012)
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