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ORCID"A Single Input Change Test Pattern Generator for Sequential Circuits."
Feng Liang, Shaochong Lei, Zhibiao Shao (2008)
- Feng Liang, Shaochong Lei, Zhibiao Shao:
A Single Input Change Test Pattern Generator for Sequential Circuits. IEICE Trans. Electron. 91-C(8): 1365-1370 (2008)
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