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"A Study on Temporal Dark Image Sticking in AC-PDP Using Vacuum-Sealing Method."

Choon-Sang Park, Heung-Sik Tae (2009)

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DOI: 10.1587/TRANSELE.E92.C.161

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
  - journals/ieicet/ParkT09
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/ParkT09
Choon-Sang Park, Heung-Sik Tae:
A Study on Temporal Dark Image Sticking in AC-PDP Using Vacuum-Sealing Method. IEICE Trans. Electron. 92-C(1): 161-165 (2009)

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