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"Multilevel Ionizing-Induced Transient Fault Simulator."

Feng Lu et al. (2013)

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DOI: 10.1080/19393555.2014.891280

access: closed

type: Journal Article

metadata version: 2020-03-04

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  - https://dblp.org/rec/journals/isjgp/LuNFR13
Feng Lu, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
Multilevel Ionizing-Induced Transient Fault Simulator. Inf. Secur. J. A Glob. Perspect. 22(5-6): 251-264 (2013)

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