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"BIST Design for Detecting Multiple Stuck-Open Faults in CMOS Circuits ..."

Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya (2002)

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DOI: 10.1007/BF02960763

access: closed

type: Journal Article

metadata version: 2019-10-22

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Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya:
BIST Design for Detecting Multiple Stuck-Open Faults in CMOS Circuits Using Transition Count. J. Comput. Sci. Technol. 17(6): 731-737 (2002)

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