"Methodology for ensuring high reliability of VLSI systems."

Byung-gi Kim, Hoon Chang, Jung Wan Cho (1997)

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type: Journal Article

metadata version: 2020-05-19

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Byung-gi Kim, Hoon Chang, Jung Wan Cho:
Methodology for ensuring high reliability of VLSI systems. J. Syst. Archit. 43(1-5): 111-117 (1997)

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