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"Reliability over consecutive releases of a semiconductor Optical Endpoint ..."

Eric Abuta, Jeff Tian (2018)

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DOI: 10.1016/J.JSS.2017.12.006

access: closed

type: Journal Article

metadata version: 2022-03-16

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Eric Abuta, Jeff Tian:
Reliability over consecutive releases of a semiconductor Optical Endpoint Detection software system developed in a small company. J. Syst. Softw. 137: 355-365 (2018)

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