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"A 16 nm All-Digital Auto-Calibrating Adaptive Clock Distribution for ..."

Keith A. Bowman et al. (2016)

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DOI: 10.1109/JSSC.2015.2473655

access: closed

type: Journal Article

metadata version: 2021-04-09

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  - https://dblp.org/rec/journals/jssc/BowmanRBYNAKJAH16
Keith A. Bowman, Sarthak Raina, Todd Bridges, Daniel Yingling, Hoan Nguyen, Brad Appel, Yesh Kolla, Jihoon Jeong, Francois Atallah, David Hansquine:
A 16 nm All-Digital Auto-Calibrating Adaptive Clock Distribution for Supply Voltage Droop Tolerance Across a Wide Operating Range. IEEE J. Solid State Circuits 51(1): 8-17 (2016)

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