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"Determination of cut-off time of accelerated aging test under temperature ..."

Jian Hao et al. (2017)

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DOI: 10.1631/FITEE.1500483

access: closed

type: Journal Article

metadata version: 2020-03-05

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  - journals/jzusc/HaoJKWGWSX17
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  - https://dblp.org/rec/journals/jzusc/HaoJKWGWSX17
Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu:
Determination of cut-off time of accelerated aging test under temperature stress for LED lamps. Frontiers Inf. Technol. Electron. Eng. 18(8): 1197-1204 (2017)

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