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"FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects."

Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Augusto da Luz Reis (2016)

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DOI: 10.1016/J.MICROREL.2016.07.133

access: closed

type: Journal Article

metadata version: 2020-02-22

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Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Augusto da Luz Reis:
FDSOI and Bulk CMOS SRAM Cell Resilience to Radiation Effects. Microelectron. Reliab. 64: 152-157 (2016)

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